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Information on didactic, research and institutional assignments on this page are certified by the University; more information, prepared by the lecturer, are available on the personal web page and in the curriculum vitae indicated on this webpage.
Information
LecturerSottocornola Spinelli Alessandro
QualificationFull professor full time
Belonging DepartmentDipartimento di Elettronica, Informazione e Bioingegneria
Scientific-Disciplinary SectorIINF-01/A - Electronics
Curriculum VitaeDownload CV (104.85Kb - 25/11/2021)
OrcIDhttps://orcid.org/0000-0002-3290-6734

Contacts
Office hours
DepartmentFloorOfficeDayTimetableTelephoneFaxNotes
Elettronica e Informazione - ED22---002MondayFrom 14:00
To 16:00
02.2399.4001---Su appuntamento
E-mailalessandro.spinelli@polimi.it
Personal websitespinelli.faculty.polimi.it

Data source: RE.PUBLIC@POLIMI - Research Publications at Politecnico di Milano

List of publications and reserach products for the year 2025 (Show all details | Hide all details)
Type Title of the Publicaiton/Product
Journal Articles
Device edge termination effects on TDDB in galvanic isolators based on polymeric dielectrics (Show >>)


List of publications and reserach products for the year 2024 (Show all details | Hide all details)
Type Title of the Publicaiton/Product
Conference proceedings
Investigation of the moisture-driven dynamics of time-dependent dielectric breakdown in polymeric dielectrics for galvanic isolators (Show >>)
Journal Articles
Discrete-Trap Effects on 3-D NAND Variability – Part I: Threshold Voltage (Show >>)
Discrete-Trap Effects on 3-D NAND Variability – Part II: Random Telegraph Noise (Show >>)
Evidence of Widely Distributed Time Constants in the Vertical Charge Loss of 3-D Charge-Trap NAND Flash Memories (Show >>)
Experimental and Modeling Investigation of the Temperature Activation of TDDB in Galvanic Isolators Based on Polymeric Dielectrics (Show >>)
First Evidence of SET-Like Behavior of 3-D NAND Flash Cells in the Deep-Cryogenic Regime (Show >>)
Origin of the Temperature Dependence of Gate-Induced Drain Leakage-Assisted Erase in Three-Dimensional NAND Flash Memories (Show >>)


List of publications and reserach products for the year 2023 (Show all details | Hide all details)
Type Title of the Publicaiton/Product
Conference proceedings
Depassivation of Traps in the Polysilicon Channel of 3D NAND Flash Arrays: Impact on Cell High-Temperature Data Retention (Show >>)
Modeling the Temperature Dependence of TDDB in Galvanic Isolators Based on Polymeric Dielectrics (Show >>)
Understanding the impact of polysilicon percolative conduction on 3D NAND variability (Show >>)
Journal Articles
Analysis of High-Temperature Data Retention in 3D Floating-Gate NAND Flash Memory Arrays (Show >>)


List of publications and reserach products for the year 2022 (Show all details | Hide all details)
Type Title of the Publicaiton/Product
Conference proceedings
Investigation of the Statistical Spread of the Time-Dependent Dielectric Breakdown in Polymeric Dielectrics for Galvanic Isolation (Show >>)
Recent Advances in the Understanding of Random Telegraph Noise in 3–D NAND Flash memories (Show >>)
Journal Articles
Modeling of ferroelectric tunnel junctions based on the Pt/BaTiO3/Nb:SrTiO3 stack (Show >>)
Random Telegraph Noise Intensification After High-Temperature Phases in 3-D NAND Flash Arrays (Show >>)
Time Dynamics of the Down-Coupling Phenomenon in 3-D NAND Strings (Show >>)


List of publications and reserach products for the year 2021 (Show all details | Hide all details)
Type Title of the Publicaiton/Product
Conference proceedings
High-Density Solid-State Storage: A Long Path to Success (Show >>)
Journal Articles
A Noise-Resilient Neuromorphic Digit Classifier Based on NOR Flash Memories with Pulse-Width Modulation Scheme (Show >>)
A comparison of modeling approaches for current transport in polysilicon‑channel nanowire and macaroni GAA MOSFETs (Show >>)
Random telegraph noise in 3d nand flash memories (Show >>)
manifesti v. 3.9.3 / 3.9.3
Area Servizi ICT
28/04/2025